Education and Information Technologies | Home
NiDS2022 (Novel & Intelligent Digital Systems) - ATHENS
PDF) On the Generation of Functional Test Programs for the Cache Replacement Logic
PDF) New Algorithms for Address Decoder Delay Faults and Bit Line Imbalance Faults
ERCIM News 96 by Peter Kunz - Issuu
Education and Information Technologies | Home
PDF) Efficient Test Compaction for Pseudo-Random Testing
PDF) An adaptive BIST to detect multiple stuck-open faults in CMOS circuits
PDF) Survival analysis for modeling critical events that communities may undergo in dynamic social networks
PDF) A Low-Cost BIST Scheme for Test Vector Embedding in Accumulator-Generated Sequences
PDF) Memory testing with a RISC microcontroller
PDF) Pseudorandom, Weighted Random and Pseudoexhaustive Test Patterns Generated in Universal Cellular Automata
PDF) Concurrent Self-Test with Partially Specified Patterns For Low Test Latency and Overhead
PDF) Multimode scan: Test per clock BIST for IP cores
PDF) Detection of Delay Faults in Memory Address Decoders
PDF) Detection of Delay Faults in Memory Address Decoders
PDF) Extending Internet into Space – ESA DTN Testbed Implementation and Evaluation
Latest Award Winners
PDF) A Low-Cost BIST Scheme for Test Vector Embedding in Accumulator-Generated Sequences
Dimitris Magos's research works | University of West Attica, Athens (TEIATH) and other places
Steffen Tarnick's research works | Universität Potsdam, Potsdam and other places
